All On X - Scan Ladder

Originally designed by Prof Adam Nulty in 2018, the Scan Ladder(TM) has been through several iterations. The first version was developed and launched in 2018 in the dental market to improve accuracy in full arch scans in edentulous cases.

Since 2018 the Scan Ladder has evolved through several iterations to increase function and accuracy in application. Namely, through the development of the random scanning surface, similar features/surfaces that can cause error are avoided. There is no tie to specific workflows, manufacturers, labs or scanners.

The newest patented version designed by Prof Nulty is the ONLY full arch accuracy tool that combines simplicity, openness and a completely random structure. This random surface is key to ultimate accuracy.